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About Misplana, flatness and planarity measurement system

The System is engineered to evaluate flatness defects on a metal and non metal strip, plate or flat product . It is made up by:

  • Solid built structure to support and move sensors, entirely motorized and controlled in position.

  • Control and Maintenance Panel

  • Operator's Console


The Structure is mounted on the process line and support the measurement device. The device is mounted on the structure using a screw regulation system to ensure the perfect alignment and parallelism. The measurement device is equipped with precision guides with high quality standards hardware.
  • generate views of physical and thermal gradients

  • calculate operational parameters such as deviation from center, overall width, camber, hook, etc.

  • alarm in case of excessive conditions, such as excessive hook

As defect, in general terms, is considered a variation of the strip flatness or in other terms a variation of the distance between the strip and the reference surface. Naturally variation can be positive or negative. This variation in commonly called wave. The determination of the wave shape is made considering both distance and position evaluated respectively using lasers (mounted on the structure along X Axis) and the encoders (mounted on the structure along Y Axis). When the wave shape is defined, the system provides the entity and the classification of the defect using mathematical formulas.

Defect Classification
Defect Position: the strip is virtually divided into 5 areas (left border, left quarter, center, right quarter, right border). The defect is associated to one of this area

  • Model's name

    Misplana

  • Measurement type

    Laser flatness measurement system

  • Capable to evaluate

    Defect Height (H) : difference between max and min measured values. During scan is possible that more than one maximum or minimum is encountered. In this case values are taken in couple of two.

    Defect Wave Length :(L): distance between the two minimum values corresponding to the maximum.

    Percentage Wave Index: (IO)

  • DATA OUTPUT

    I Unit (IU) : 24,67*sqr(IO)

details

Available on Protocol (PROFIBUS / PROFINET / ETHERNET)

  • WAVE INDEX (IO)

  • UNIT INDEX (IU)

  • DEFECT LONGITUDINAL WAVE-LENGTH (L)

  • DEFECT HEIGHT (H)

  • DEFECT POSITION (ONLY FOR LONGITUDINAL)

  • DEFECT CLASSIFICATION

  • SENSOR POSITION

  • SYSTEM STATUS

  • MOVEMENT LOCK/OUT

One of the most efficient solution for surface defect analysis
  • Real time measurements with Real time Library (On-Time RT Kernel)
  • Control Software is a proven program developed in C language