In-line and non-contact thickness control is a key element for the quality of the final product. Systems based on the measurement of density by absorption still represent the only possible solution for complex lines and critical environments. Laser or surface current systems can be an economic alternative only on clean rework lines, on non-reflective surfaces or in very special cases where there are no criticalities. The same non-contact technology offered lends itself to detecting not only the thickness, but the continuity and density of an artifact. It is therefore able to compare densities and thicknesses even without quantifying them. In some conditions, a laser measurement by triangulation can be very useful to provide, at steady line, a data with an accuracy, albeit not micrometric, an absolute preset value of the X-ray system. The latter is just an example of how we combine different technologies into integrated systems to perform advanced functions. The ultimate goal is not only to provide a datum of the thickness measurement in a given point or surface, but to use numbers to optimize the process.